Measurement of two particle resolution in silicon drift...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Measurement of two particle resolution in silicon drift detectors

Pandey, S.U., Bellwied, R., Beuttenmueller, R., Caines, H., Chen, W., DiMassimo, D., Dyke, H., Hall, J., Hoffmann, G.W., Humanic, T.J., Kuczewski, P., Kotov, I.V., Kraner, H.W., Leonhardt, B., Liaw, C
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682400
Date:
June, 1998
File:
PDF, 830 KB
english, 1998
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