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Charge trapping on different cuts of a single-crystalline α-SiO2
Gong, H., Le Gressus, C., Oh, K. H., Ding, X. Z., Ong, C. K., Tan, B. T. G.Volume:
74
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.354778
File:
PDF, 826 KB
english, 1993