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[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Non-linear Operating Point Statistical Analysis for Local Variations in logic timing at low voltage
Rithe, Rahul, Jie Gu,, Wang, Alice, Datla, Satyendra, Gammie, Gordon, Buss, Dennis, Chandrakasan, AnanthaYear:
2010
Language:
english
DOI:
10.1109/date.2010.5456911
File:
PDF, 487 KB
english, 2010