[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Using nanoprobing and SEM doping contrast techniques for failure analysis of current leakage in CMOS HV technology
Lin, Hung Sung, Wang, RandyYear:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232705
File:
PDF, 12.16 MB
english, 2009