Test of the Jarzynski and Crooks Fluctuation Relations in an Electronic System
Saira, O.-P., Yoon, Y., Tanttu, T., Möttönen, M., Averin, D. V., Pekola, J. P.Volume:
109
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.109.180601
Date:
October, 2012
File:
PDF, 438 KB
english, 2012