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Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs
Schwank, James R., Shaneyfelt, Marty R., Dodd, Paul E., McMorrow, Dale, Warner, Jeffrey H., Ferlet-Cavrois, Véronique, Gouker, Pascale M., Melinger, Joseph S., Pellish, Jonathan A., Rodbell, Kenneth PVolume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2171006
Date:
December, 2011
File:
PDF, 990 KB
english, 2011