Characterization of AlN metal-semiconductor-metal diodes in...

Applied Physics Letters 2008 Vol. 92; Iss. 2

Characterization of AlN metal-semiconductor-metal diodes in the spectral range of 44–360 nm: Photoemission assessments

BenMoussa, A., Hochedez, J. F., Dahal, R., Li, J., Lin, J. Y., Jiang, H. X., Soltani, A., De Jaeger, J.-C., Kroth, U., Richter, M.
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Volume:
92
Year:
2008
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2834701
File:
PDF, 283 KB
english, 2008
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