[IEEE IECON 2006 - 32nd Annual Conference on IEEE...

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[IEEE IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Paris, France (2006.11.6-2006.11.10)] IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - 3D Image Analysis for Evaluating Internal Deformation / Fracture Characteristics of Materials

Nakazawa, Mitsuru, Aoki, Yoshimitsu, Kawai, Yuji, Kobayashi, Masakazu, Toda, Hiroyuki
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Year:
2006
Language:
english
DOI:
10.1109/iecon.2006.347950
File:
PDF, 5.14 MB
english, 2006
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