[IEEE IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Paris, France (2006.11.6-2006.11.10)] IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - 3D Image Analysis for Evaluating Internal Deformation / Fracture Characteristics of Materials
Nakazawa, Mitsuru, Aoki, Yoshimitsu, Kawai, Yuji, Kobayashi, Masakazu, Toda, HiroyukiYear:
2006
Language:
english
DOI:
10.1109/iecon.2006.347950
File:
PDF, 5.14 MB
english, 2006