Optimisation of VCD Format and Testbench Reuse in...

IETE Journal of Research 2008 / 01 Vol. 54; Iss. 1

Optimisation of VCD Format and Testbench Reuse in Implementation of ASIC Tester

Wani, Prakash W, Mehta, Rakesh, Talware, Rajendra S, Patil, Ganesh C
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Volume:
54
Language:
english
Journal:
IETE Journal of Research
DOI:
10.1080/03772063.2008.10876177
Date:
January, 2008
File:
PDF, 640 KB
english, 2008
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