Reliability Analysis of Small-Delay Defects Due to Via...

IEEE Design and Test 2013 / 12 Vol. 30; Iss. 6

Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths

Villacorta, Hector, Hawkins, Chuck, Champac, Victor, Segura, Jaume, Gomez, Roberto
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Volume:
30
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/mdt.2013.2238578
Date:
December, 2013
File:
PDF, 952 KB
english, 2013
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