Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa[sub 2]Cu[sub 3]O[sub 7−δ] films of variable thickness
Dizon, Jonathan R., Wang, Xiang, Wu, Judy Z.Volume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3259372
File:
PDF, 873 KB
english, 2010