Two-dimensional x-ray photoelectron diffraction...

Review of Scientific Instruments 1989 Vol. 60; Iss. 7

Two-dimensional x-ray photoelectron diffraction measurements by a retarding field-type analyzer

Kanayama, S., Owari, M., Nakamura, E., Nihei, Y.
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Volume:
60
Year:
1989
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1140777
File:
PDF, 778 KB
english, 1989
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