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Measurement of residual stress in multicrystalline silicon ribbons by a self-calibrating infrared photoelastic method
Brito, M. C., Pereira, J. P., Maia Alves, J., Serra, J. M., Vallera, A. M.Volume:
76
Year:
2005
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1823654
File:
PDF, 450 KB
english, 2005