[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Low Power Embedded Deterministic Test
Czysz, Dariusz, Mrugalski, Grzegorz, Rajski, Janusz, Tyszer, JerzyYear:
2007
Language:
english
DOI:
10.1109/vts.2007.37
File:
PDF, 269 KB
english, 2007