![](/img/cover-not-exists.png)
Measuring the electronic corrugation at the metal/organic interface
Caplins, Benjamin W., Shearer, Alex J., Suich, David E., Muller, Eric A., Harris, Charles B.Volume:
89
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.89.155422
Date:
April, 2014
File:
PDF, 1.12 MB
english, 2014