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[IEEE Conference on Precision Electromagnetic: Measurements - Washington, DC, USA (6-10 July 1998)] 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) - The effect of residual adsorbed gases on silicon isotope amount ratio measurements [in Avogadro constant determination]
Valkiers, S., Gonfiantini, R., Taylor, P., De Bievre, P.Year:
1998
Language:
english
DOI:
10.1109/cpem.1998.699967
File:
PDF, 72 KB
english, 1998