![](/img/cover-not-exists.png)
Nanometer-scale linewidth fluctuations caused by polymer aggregates in resist films
Yamaguchi, Toru, Namatsu, Hideo, Nagase, Masao, Yamazaki, Kenji, Kurihara, KenjiVolume:
71
Year:
1997
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.120037
File:
PDF, 302 KB
english, 1997