[IEEE International Test Conference 1992 - Baltimore, MD (Sept. 20-24 1992)] Proceedings International Test Conference 1992 - Robustsless Enhancement And Detection Threshold Reduction In ATPG For Gate Delay Faults
Weiwei Mao,, Giletti, M.D.Year:
1992
Language:
english
DOI:
10.1109/test.1992.527879
File:
PDF, 1023 KB
english, 1992