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Ferrule-top atomic force microscope
Chavan, D., Gruca, G., de Man, S., Slaman, M., Rector, J. H., Heeck, K., Iannuzzi, D.Volume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3516044
File:
PDF, 923 KB
english, 2010