Microspectroscopy and imaging using a delay line detector in time-of-flight photoemission microscopy
Oelsner, A., Schmidt, O., Schicketanz, M., Klais, M., Schönhense, G., Mergel, V., Jagutzki, O., Schmidt-Böcking, H.Volume:
72
Year:
2001
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1405781
File:
PDF, 1016 KB
english, 2001