Single-shot nanosecond thermal imaging of semiconductor...

IEEE Transactions on Device and Materials Reliability 2003 / 09 Vol. 3; Iss. 3

Single-shot nanosecond thermal imaging of semiconductor devices using absorption measurements

Pogany, D., Dubec, V., Bychikhin, S., Furbock, C., Litzenberger, M., Naumov, S., Groos, G., Stecher, M., Gornik, E.
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Volume:
3
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2003.815276
Date:
September, 2003
File:
PDF, 468 KB
english, 2003
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