Electrical stress effect on Josephson tunneling through...

Electrical stress effect on Josephson tunneling through ultrathin AlO[sub x] barrier in Nb/Al/AlO[sub x]/Nb junctions

Tolpygo, Sergey K., Amparo, Denis
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Volume:
104
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2977725
File:
PDF, 1.04 MB
english, 2008
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