Microstructure and dislocation of epitaxial InN films...

Journal of Applied Physics 2008 Vol. 103; Iss. 2

Microstructure and dislocation of epitaxial InN films revealed by high resolution x-ray diffraction

Liu, B., Zhang, R., Xie, Z. L., Lu, H., Liu, Q. J., Zhang, Z., Li, Y., Xiu, X. Q., Chen, P., Han, P., Gu, S. L., Shi, Y., Zheng, Y. D., Schaff, W. J.
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Volume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2832753
File:
PDF, 570 KB
english, 2008
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