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thin films and implications for antiferromagnetism
Ha, Sieu D., Jaramillo, R., Silevitch, D. M., Schoofs, Frank, Kerman, Kian, Baniecki, John D., Ramanathan, ShriramVolume:
87
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.87.125150
Date:
March, 2013
File:
PDF, 985 KB
english, 2013