[IEEE 2006 SICE-ICASE International Joint Conference - Busan Exhibition & Convention Center-BEXCO, Busan, Korea (2006.10.18-2006.10.21)] 2006 SICE-ICASE International Joint Conference - Development of Bridge Diagnosis Technology by Independent Component Analysis
Cheon, Jong-in, Hsieh, Ming-yuan, Yeh, Yi-chun, Ogai, Harutoshi, Inujima, HiroshiYear:
2006
Language:
english
DOI:
10.1109/sice.2006.314731
File:
PDF, 6.03 MB
english, 2006