[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - Development of a Measuring Device for the Parasitic Inductance of the DC-link Backplane of an Inverter
Bolsens, Bruno, Van den Keybus, Jeron, Driesen, Johan, Belmans, RonnieYear:
2006
Language:
english
DOI:
10.1109/imtc.2006.328218
File:
PDF, 408 KB
english, 2006