Reducing the switching activity of test sequences under...

ACM Transactions on Design Automation of Electronic Systems 2011 / 03 Vol. 16; Iss. 2

Reducing the switching activity of test sequences under transparent-scan

Pomeranz, Irith, Reddy, Sudhakar M.
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Volume:
16
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/1929943.1929949
Date:
March, 2011
File:
PDF, 176 KB
english, 2011
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