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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology
Mehta, Vishal, Marek-Sadowska, Malgorzata, Tsai, Kun-han, Rajski, JanuszYear:
2006
Language:
english
DOI:
10.1109/test.2006.297626
File:
PDF, 11.89 MB
english, 2006