[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL, USA (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Stressed jitter analysis for physical link characterization
Radhakrishnan, Nitin, Achkir, Brice, Fan, Jun, Drewniak, James L.Year:
2010
Language:
english
DOI:
10.1109/isemc.2010.5711339
File:
PDF, 578 KB
english, 2010