Goodness-of-fit tests for the two parameter Weibull distribution
Littell, Ramon C., Mc Clave, James T., Offen, Walter W.Volume:
8
Language:
english
Journal:
Communications in Statistics - Simulation and Computation
DOI:
10.1080/03610917908812118
Date:
January, 1979
File:
PDF, 368 KB
english, 1979