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[IEEE 2014 IEEE Custom Integrated Circuits Conference - CICC 2014 - San Jose, CA, USA (2014.9.15-2014.9.17)] Proceedings of the IEEE 2014 Custom Integrated Circuits Conference - SRAM read performance degradation under asymmetric NBTI and PBTI stress: Characterization vehicle and statistical aging data
Wang, Xiaofei, Xu, Weichao, Kim, Chris H.Year:
2014
Language:
english
DOI:
10.1109/cicc.2014.6946132
File:
PDF, 470 KB
english, 2014