Fast Analysis of a Large-Scale Inductive Interconnect by...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2010 / 10 Vol. 18; Iss. 10

Fast Analysis of a Large-Scale Inductive Interconnect by Block-Structure-Preserved Macromodeling

Yu, Hao, Chu, Chunta, Shi, Yiyu, Smart, David, He, Lei, Tan, Sheldon X.-D.
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Volume:
18
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2009.2024343
Date:
October, 2010
File:
PDF, 1.01 MB
english, 2010
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