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[IEEE 2013 10th IEEE International Conference on Control and Automation (ICCA) - Hangzhou, China (2013.06.12-2013.06.14)] 2013 10th IEEE International Conference on Control and Automation (ICCA) - A KPI-related multiplicative fault diagnosis scheme for industrial processes
Hao, Haiyang, Zhang, Kai, Ding, Steven X., Chen, Zhiwen, Lei, Yaguo, Hu, ZhikunYear:
2013
Language:
english
DOI:
10.1109/icca.2013.6565167
File:
PDF, 217 KB
english, 2013