Relationship between edge drift and atomic migration during...

Journal of Applied Physics 2006 Vol. 100; Iss. 3

Relationship between edge drift and atomic migration during electromigration of eutectic SnPb lines

Yoon, Min-Seung, Lee, Shin-Bok, Kim, Oh-Han, Park, Young-Bae, Joo, Young-Chang
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Volume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2210262
File:
PDF, 713 KB
english, 2006
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