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Characteristics and stress-induced degradation of laser-activated low temperature polycrystalline silicon thin-film transistors
Peng, Du-Zen, Chang, Ting-Chang, Chang, Chun-Yen, Tsai, Ming-Liang, Tu, Chun-Hao, Liu, Po-TsunVolume:
93
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1535732
File:
PDF, 995 KB
english, 2003