Statistical description of strongly damped binary yields...

Physical Review C 1997 / 7 Vol. 56; Iss. 1

Statistical description of strongly damped binary yields from the 28Si+16O reaction

Szanto de Toledo, A., Sanders, S., Beck, C.
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Volume:
56
Language:
english
Journal:
Physical Review C
DOI:
10.1103/PhysRevC.56.558
Date:
July, 1997
File:
PDF, 75 KB
english, 1997
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