[IEEE 2012 1st International Conference on Emerging Technology Trends in Electronics, Communication and Networking (ET2ECN) - Surat, Gujarat, India (2012.12.19-2012.12.21)] 2012 1st International Conference on Emerging Technology Trends in Electronics, Communication & Networking - An analytical surface potential and threshold voltage model of fully depleted strained-SOI MOSFETs in nanoscale with high-k gate oxide
Kumar Prasannajit Pradhan,, Sushanta Kumar Mohapatra,, Prasanna Kumar Sahu,Year:
2012
Language:
english
DOI:
10.1109/et2ecn.2012.6470076
File:
PDF, 975 KB
english, 2012