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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - 1/2.5" 8 mega-pixel CMOS Image Sensor with enhanced image quality for DSC application
Kim, Jinho, Shin, Jongchol, Moon, Chang-Rok, Lee, Seok-Ha, Park, Doo-Cheol, Jeong, Heegeun, Kwon, Doowon, Jung, Jongwan, Noh, Hyunpil, Lee, Kangbok, Koh, Kwangok, Lee, Duckhyung, Kim, KinamYear:
2006
Language:
english
DOI:
10.1109/iedm.2006.346975
File:
PDF, 1.17 MB
english, 2006