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[IEEE 32nd European Microwave Conference, 2002 - Milan, Italy (2002.10.4-2002.10.6)] 32nd European Microwave Conference, 2002 - A Rigorous Approach for Calibrating Six-Port Reflectometers
Chahine, S. Abou, Neveux, G., Huyart, B.Year:
2002
Language:
english
DOI:
10.1109/euma.2002.339478
File:
PDF, 2.69 MB
english, 2002