![](/img/cover-not-exists.png)
Permanent recovery of electron lifetime in pre-annealed silicon samples: A model based on Ostwald ripening
Voronkov, V. V., Falster, R., Lim, B., Schmidt, J.Volume:
112
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4768688
File:
PDF, 1008 KB
english, 2012