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[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Non-destructive broadband material characterization over the K-band using whispering-gallery-mode resonators
Kheir, Mohamed S., Ham, Hany F., Omar, AbbasYear:
2010
Language:
english
DOI:
10.1109/cpem.2010.5544214
File:
PDF, 239 KB
english, 2010