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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - How far will silicon nanocrystals push the scaling limits of NVMs technologies?
De Salvo, B., Gerardi, C., Lombardo, S., Baron, T., Perniola, L., Mariolle, D., Mur, P., Toffoli, A., Gely, M., Semeria, M.N., Deleonibus, S., Ammendola, G., Ancarani, V., Melanotte, M., Bez, R., BaldYear:
2003
Language:
english
DOI:
10.1109/iedm.2003.1269352
File:
PDF, 334 KB
english, 2003