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[IEEE 9th International Vacuum Microelectronics Conference - St. Petersburg, Russia (7-12 July 1996)] 9th International Vacuum Microelectronics Conference - Degradation of formed metal-insulator-metal cathodes under pulsed bias
Kramor, S.S., Troyan, P.E., Khaskelberg, M.B.Year:
1996
Language:
english
DOI:
10.1109/ivmc.1996.601796
File:
PDF, 297 KB
english, 1996