Depth and lateral extension of ion milled pn junctions in Cd[sub x]Hg[sub 1−x]Te from electron beam induced current measurements
Haakenaasen, R., Moen, T., Colin, T., Steen, H., Trosdahl-Iversen, L.Volume:
91
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1419214
File:
PDF, 400 KB
english, 2002