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[IEEE 2013 Annual IEEE India Conference (INDICON) - Mumbai, India (2013.12.13-2013.12.15)] 2013 Annual IEEE India Conference (INDICON) - Process and device simulations to study the impact of Ge profile of 65 nm NPN SOI HBT with buried layer
Misra, Prasanna Kumar, Patil, Ganesh C., Qureshi, S.Year:
2013
Language:
english
DOI:
10.1109/indcon.2013.6726051
File:
PDF, 1.45 MB
english, 2013