Impact of Random Soft Oxide Breakdown on SRAM Energy/Delay...

IEEE Transactions on Device and Materials Reliability 2007 / 12 Vol. 7; Iss. 4

Impact of Random Soft Oxide Breakdown on SRAM Energy/Delay Drift

Wang, Hua, Miranda, Miguel, Catthoor, Francky, Dehaene, Wim
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Volume:
7
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2007.910444
Date:
December, 2007
File:
PDF, 1.07 MB
english, 2007
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