Phase and structural characterization of vanadium oxide films grown on amorphous SiO[sub 2]/Si substrates
Youn, Doo-Hyeb, Kim, Hyun-Tak, Chae, Byung-Gue, Hwang, Young-Joo, Lee, Ju-Wook, Maeng, Sung-Lyul, Kang, Kwang-YongVolume:
22
Year:
2004
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1723217
File:
PDF, 1.08 MB
english, 2004