[IEEE IEEE Sensors, 2005. - Irvine, CA, USA (Oct. 31,...

  • Main
  • [IEEE IEEE Sensors, 2005. - Irvine, CA,...

[IEEE IEEE Sensors, 2005. - Irvine, CA, USA (Oct. 31, 2005)] IEEE Sensors, 2005. - A Robust MEMS Probe Card for Fine Pitch Test Using a New Cantilever Moving Scheme

Doo-Yun Chung,, Bong-Hwan Kim,, Chi-Hwan Chung,, Choon-Bae Park,, Jong-Ho Lee,, Kukjin Chun,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2005
Language:
english
DOI:
10.1109/icsens.2005.1597964
File:
PDF, 928 KB
english, 2005
Conversion to is in progress
Conversion to is failed