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Formation of epitaxial CoSi[sub 2] by a Cr or Mo interlayer: Comparison with a Ti interlayer
Detavernier, C., Van Meirhaeghe, R. L., Cardon, F., Maex, K., Bender, H., Brijs, B., Vandervorst, W.Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1340598
File:
PDF, 515 KB
english, 2001