[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Size Effects and Temperature Dependence of Stress-Induced Voiding
Hommel, Martina, Penka, SabineYear:
2006
DOI:
10.1109/relphy.2006.251324
File:
PDF, 192 KB
2006